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People Jean R. Blachère

Associate Professor Emeritus, Department of Mechanical Engineering and Materials Science

Phone: 412-648-8427 or 8-8375
Fax: 412-624-8069
Office: BENDM 1178A

Education

PhD, Ceramic Science, SUNY at Alfred University, 1969.

Professional Interests

Professor Blachère's research interests are in ceramics and glasses, high temperature materials, refractories. He has focused on the characterization of materials using scanning electron microscopy and X-ray diffraction, particularly on films.

Selected Publications

A.R. Deshpande, J.R. Blachere and J.M.K. Wiezorek, "Ferromagnetic Llo-ordered Fe-Pd Intermetallics", Scripta Met. (in press).

Y.S. Jung, Z. Sun, H.K. Kim and J. Blachere, "Blueshift of Surface Plasmon Resonance Spectra in Anneal-Treated Silver Nanoslit Arrays", Applied Physics Letters, 87, 263116-1 to 263116-3 (2005).

J. R. Blachere, E. Schumann, F. S. Pettit and G. H. Meier, "Textures of FeCrAl Scales" Scripta Mat 49 (2003) 909-912.

J. Blachere, R. Peraldi, D. Monceau, T. Cutard and B. Pieraggi, "Orientation Relation Between Ni and NiO and its Evolution During Oxide Growth", in High Temperature Corrosion and Materials Chemistry IV, E. Opila et al, Editors, ECS Meeting Proc, PV2003-16, pp. 189-190.

M. Liu, H. K. Kim, and J. Blachère, "Lead-Zirconate-Titanate-Based Metal/Ferroelectric/Insulator/Semiconductor Structure for Non-Volatile Memories", Journal of Applied Physics, 91, 5985-5996 (2002)

A. Nahhas, H. K. Kim, and J. Blachère, "Epitaxial Growth of ZnO Films on Si Substrates Using an Epitaxial GaN buffer", Applied Physics Letters, 78, 1511-1513 (2001)

E. Schumann, C. Sarioglu, J. R. Blachère, F. S. Pettit, and G. H. Meier, "High Temperature Stress Measurements During Oxidation of NiAl", Oxid. Metals, 53, 259 (2000).

C.Sarioglu, E. Schumann, J.R.Blachère , F.S. Pettit and G.H.Meier, "X-Ray Determination of Stresses in Alumina Scales on High Temperature Alloys", Materials at High Temperatures, 17(1), 2000.

T. J. Klemmer, V. Inturi, K. Minor, J. Barnard, J. Thomas, and J.R.Blachère, "Microstructure and Crystallographic Texture of Reactivity Sputtered FeTaN Films", Thin Solid Films, 353, pp 16-19, 1999.

C.Sarioglu, J.R.Blachère, F.S. Pettit and G.H.Meier, "Room Temperature and 'In-situ' High Temperature Strain or Stress Measurements by XRD Techniques", Oxidation of Metals 3, p 21, 1997.

Curriculum Vitae

Dr. Blachère came to the Faculty in 1968 to develop the ceramic component of the materials program. He was named Associate Professor in 1974 and has served as acting chairman of the Department. His current research involves the characterization of materials by X-ray diffraction (XRD) and Scanning Electron Microscopy. He has developed a special interest in the characterization of thin films and the measurement of stresses, in particular of oxide scales by XRD. He has had a long-term interest in refractories and glasses.

Before joining the Faculty he worked at Domtar (Canada) where he started the ceramic laboratory in their Central Research Laboratories. Dr Blachère is a member of the American Ceramic Society, the Ceramic Educational Council and the National Institute of Ceramic Engineers. He is a member of the Materials Research Society and the Microscopy Society of America.  He received the A. V. Bleininger Award in 2003.

Benedum Hall

Dedicated in 1971, Benedum Hall is home to exploration and discovery.